TEL / TOKYO ELECTRON

P-8XL

TEL / TOKYO ELECTRON P8 is a Probers system. the TEL P8 can be used with a 200mm wafer size.

The TEL / TOKYO ELECTRON P12XL is a Probers system. The TEL / TOKYO ELECTRON P12XL can be used with Wafer Size of 12".

P-12XL

There are an increasing variety of test requirements in conjunction with diversified device design, device application, process node shrink and package design complexity. To reduce total test cost, especially in Memory applications, multi-site probe cards were introduces as a way of reducing test cost. This method found its limit when single wafer/one-touch-down probe card technology appeared. Cellcia™ is a breakthrough technology. Splitting wafer lots into the Cellcia™ multi-cell probe system, reduces test turn-around-time and improves system footprint by adopting a multi-layer structure. Conventional prober technology cannot achieve the Cellcia™ throughput with similar floor space. The Cellcia™ system maximizes test efficiency and minimizes total test cost. TEL has combined its vast wafer probe experience and front-end process technologies to develop the world’s leading probe system, Cellcia™.

CELLCIA

P-12XLm

The TEL / TOKYO ELECTRON CLEAN TRACK ACT 12 is a coater/developer for 200mm and 300mm wafer processing. The TEL CLEAN TRACK ACT 12 platform supports DUV processing through the use of a ULPA chemical filter and a high precision oven.

P-12XLn+

TEL / TOKYO ELECTRON P-12XLN is a wafer prober which is configured for 12" wafer sizes.

P-12XLn

This series is a fully automatic wafer-probing platform. Due to process miniaturization, higher device functionality, and package variety, demand for probing technology in the test process is becoming increasingly diversified. The Precio™ series not only has XY accuracy to realize more reliable contacts but also has greater Z-axis control, which is important for soft contact. Optimum temperature control during test, and increased of parallel die testing are achieved with the Precio™ prober series. 

PRECIO

LTI Unit

Precio nano™ is a 300mm wafer prober that realizes high accuracy contact and cleanness under high load. In the probing process, demand for probing technology has diversified as process miniaturization, high function/high integration devices and packages are changing.

PRECIO NANO

WDF DP

P-8I

Precio XL is a 300mm fully automated wafer prober which realizes high productivity, contact performance, cleanliness improvement, and short delivery time at a reduced test cost.

PRECIO XL

P-8XLm	

4400A

The WDF 12DP also benefits from the advanced hardware reliability of TELs 300mm Precio series of fully automatic wafer probers. Employing TELs patented On-Axis Alignment and N-Shot alignment feature, the WDF 12DP provides superior accuracy and the ability to test in parallel.

WDF 12DP

WDF™ 12DP + is the latest dicing frame prober with a new system platform concept that can handle and test both 300mm wafers and 300mm dicing frames with no change kit.

WDF 12DP+

The TEL / TOKYO ELECTRON PRECIO OCTO is an 8-inch wafer prober, built on TEL's Precio fully-automaic wafer prober platform. The TEL / TOKYO ELECTRON PRECIO OCTO supports TELPADS which can be installed for automatic probe mark inspection.

TEL / TOKYO ELECTRON

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Top TEL / TOKYO ELECTRON Probers

P-8XL

29 Listings

P-8

28 Listings

P-12XL

24 Listings

CELLCIA

20 Listings

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All TEL / TOKYO ELECTRON Probers