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The Precio™ XL is the latest 300mm fully automated wafer prober developed by TEL, based on their Precio™ series. This new model offers high productivity, contact performance, cleanliness improvement, and short delivery time, all with the goal of reducing test costs. It is compatible with the wafer parameters of previous Precio™ models and includes several new features such as high-speed probe mark inspection TELPADS™-I, Auto Leveling, and the optional ZOOM-I for stable and soft contact. Additionally, TEL has introduced the CoSMOz software option for more efficient setup file generation and test efficiency. This software can calculate the optimum contact sequence, a task previously performed by customer test engineers. Overall, the Precio™ XL wafer prober is a powerful tool for improving work efficiency and reducing test costs.

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