Description
No descriptionConfiguration
No ConfigurationOEM Model Description
FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.Documents
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ONTO / RUDOLPH / AUGUST
FOCUS FE VII
Verified
CATEGORY
Elipsometry
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
79353
Wafer Sizes:
6"/150mm
Vintage:
Unknown
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Money Back Guarantee
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View AllONTO / RUDOLPH / AUGUST
FOCUS FE VII
Verified
CATEGORY
Elipsometry
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
79353
Wafer Sizes:
6"/150mm
Vintage:
Unknown
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.Documents
No documents