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ONTO / RUDOLPH / AUGUST FOCUS FE VII
    Description
    Thickness Measurement
    Configuration
    No Configuration
    OEM Model Description
    FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.
    Documents

    No documents

    ONTO / RUDOLPH / AUGUST

    FOCUS FE VII

    verified-listing-icon

    Verified

    CATEGORY

    Elipsometry
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    65963

    Wafer Sizes:

    8"/200mm

    Vintage:

    2002

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    ONTO / RUDOLPH / AUGUST

    FOCUS FE VII

    verified-listing-icon

    Verified

    CATEGORY

    Elipsometry
    Last Verified: Over 60 days ago
    listing-photo-68122fc9c0a8437b93db59aeaf5c09de-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    65963

    Wafer Sizes:

    8"/200mm

    Vintage:

    2002

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Thickness Measurement
    Configuration
    No Configuration
    OEM Model Description
    FOCUS FE VII system is designed for high volume, sub-micron device manufacturing requiring superior film thickness and index of refraction measurements in diffusion, etch, CMP and CVD applications.
    Documents

    No documents

    Similar Listings
    View All
    ONTO / RUDOLPH / AUGUST FOCUS FE VII
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    ONTO / RUDOLPH / AUGUST FOCUS FE VII
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    ONTO / RUDOLPH / AUGUST FOCUS FE VII
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    ONTO / RUDOLPH / AUGUST FOCUS FE VII
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    ONTO / RUDOLPH / AUGUST FOCUS FE VII
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    ONTO / RUDOLPH / AUGUST FOCUS FE VII
    ONTO / RUDOLPH / AUGUST
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    ElipsometryVintage: 2002Condition: UsedLast Verified: Over 60 days ago