Description
Prober Probe StationConfiguration
Manual ProberOEM Model Description
The P-8XL Prober is a market innovation in the wafer probing industry by TEL. It offers superior accuracy, reliability, efficiency, and integration for the test cell through its features such as on-axis alignment, optical wafer profiling, and direct test head docking. The P-8XL is equipped with a fully interactive LCD Touch Panel Screen and TEL’s advanced On-Axis Alignment System, delivering guaranteed pin-to-pad accuracy. It also offers a range of features to overcome probe floor barriers, including Direct Coupling Test Interfaces, Automatic Probe Card Changers, Clean Air Management Systems, Temperature Controlled Chucks, and many others. With its advanced capabilities, the P-8XL is ready to meet the demands of future device complexity and measurement precision.Documents
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TEL / TOKYO ELECTRON
P-8XL
Verified
CATEGORY
Probers
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
115732
Wafer Sizes:
4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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TEL / TOKYO ELECTRON
P-8XL
CATEGORY
Probers
Last Verified: Over 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
115732
Wafer Sizes:
4"/100mm, 5"/125mm, 6"/150mm, 8"/200mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Prober Probe StationConfiguration
Manual ProberOEM Model Description
The P-8XL Prober is a market innovation in the wafer probing industry by TEL. It offers superior accuracy, reliability, efficiency, and integration for the test cell through its features such as on-axis alignment, optical wafer profiling, and direct test head docking. The P-8XL is equipped with a fully interactive LCD Touch Panel Screen and TEL’s advanced On-Axis Alignment System, delivering guaranteed pin-to-pad accuracy. It also offers a range of features to overcome probe floor barriers, including Direct Coupling Test Interfaces, Automatic Probe Card Changers, Clean Air Management Systems, Temperature Controlled Chucks, and many others. With its advanced capabilities, the P-8XL is ready to meet the demands of future device complexity and measurement precision.Documents
No documents