Description
De-installedConfiguration
-Electric source: 208V/1Ph/16A -Non-patterned wafer film surface analyzer -One automatic wafer handler -Defect map and histogram with zoom -2D signal integration -Non-contaminating robotic handler -X-Y Coordinates Software -Random access sender/receiver unitOEM Model Description
The Surfscan 6420 detects submicron defects on metal films and rough surfaces but still provides sensitivity down to 0.1 micron on polished silicon. It is effective for detecting defects on non-uniform films, a critical requirement for CMP applications.Documents
KLA
SURFSCAN 6420
Verified
CATEGORY
Defect Inspection
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
102947
Wafer Sizes:
6"/150mm
Vintage:
1998
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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KLA
SURFSCAN 6420
Verified
CATEGORY
Defect Inspection
Last Verified: 16 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
102947
Wafer Sizes:
6"/150mm
Vintage:
1998
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available