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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA CANDELA CS20
    Description
    Optical Defect Inspection
    Configuration
    No Configuration
    OEM Model Description
    The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
    Documents

    No documents

    KLA

    CANDELA CS20

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: 9 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    115111


    Wafer Sizes:

    6"/150mm


    Vintage:

    2006


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    KLA CANDELA CS20

    KLA

    CANDELA CS20

    Defect Inspection
    Vintage: 2006Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    CANDELA CS20

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: 9 days ago
    listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/dac080f264704972bf46e2083958d6eb_spk361200000copy_mw.jpg
    listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/e0a2adfeee22454c99bc1faa92f4deb1_spk36100000_mw.jpg
    listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/a42fb751d5dd4bf8bb55c68a8f3c9f16_spk361200000_mw.jpg
    listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/37f88c1bce2d401b8bd63ee9dd742c22_spk36110000copy_mw.jpg
    listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/331ef8955e014569bc185796c41389b8_spk36110000_mw.jpg
    listing-photo-8f31fa05dbc04b939778b7bb997f2e9b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/8f31fa05dbc04b939778b7bb997f2e9b/8228240b6031467f8c99873faac89295_spk36140000_mw.jpg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    115111


    Wafer Sizes:

    6"/150mm


    Vintage:

    2006


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Optical Defect Inspection
    Configuration
    No Configuration
    OEM Model Description
    The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
    Documents

    No documents

    Similar Listings
    View All
    KLA CANDELA CS20

    KLA

    CANDELA CS20

    Defect InspectionVintage: 2006Condition: UsedLast Verified:Over 60 days ago
    KLA CANDELA CS20

    KLA

    CANDELA CS20

    Defect InspectionVintage: 2006Condition: UsedLast Verified:Over 60 days ago
    KLA CANDELA CS20

    KLA

    CANDELA CS20

    Defect InspectionVintage: 2006Condition: UsedLast Verified:9 days ago