CANDELA CS20
Category
Defect InspectionOverview
The Candela CS20 system measures surface reflectivity and topography for automatic defect detection and classification. It uses scatterometry, ellipsometry, reflectometry, and topographical analysis to inspect wafer surfaces for defects and film thickness uniformity. It is designed for inspection of transparent materials such as sapphire and GaN and can detect a wide variety of defects. It is suitable for use in the production of High Brightness Light Emitting Diodes (HBLEDs), High-Power RF Devices, and Coated Glass (CMOS imagers, LCoS chips, etc.).
Active Listings
7
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- CANDELA CS20Defect InspectionVintage: Condition: RefurbishedLast Verified9 days ago
- CANDELA CS20Defect InspectionVintage: Condition: RefurbishedLast Verified16 days ago
- CANDELA CS20Defect InspectionVintage: Condition: UsedLast VerifiedOver 30 days ago
- CANDELA CS20Defect InspectionVintage: 2006Condition: UsedLast Verified30 days ago