
Description
Asset Description: BRUKER D8 FABLINE XRAY DEFRACTION Software Version: na CIM: SECS GEM Process: Profilometer X Ray DefractionConfiguration
Hardware Configuration System Type Description Quantity Main System Stage with X ray 1 Others Handler System Robot 1 Factory Interface FOUP 2 Options SystemOEM Model Description
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.Documents
No documents
Verified
CATEGORY
X-Ray / XRD / XRF
Last Verified: 29 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136267
Wafer Sizes:
12"/300mm
Vintage:
2014
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View AllBRUKER
D8 FABLINE
CATEGORY
X-Ray / XRD / XRF
Last Verified: 29 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136267
Wafer Sizes:
12"/300mm
Vintage:
2014
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Asset Description: BRUKER D8 FABLINE XRAY DEFRACTION Software Version: na CIM: SECS GEM Process: Profilometer X Ray DefractionConfiguration
Hardware Configuration System Type Description Quantity Main System Stage with X ray 1 Others Handler System Robot 1 Factory Interface FOUP 2 Options SystemOEM Model Description
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.Documents
No documents