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BRUKER D8 FABLINE
    Description
    XRD_Bruker
    Configuration
    No Configuration
    OEM Model Description
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    X-Ray / XRD / XRF

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    127899


    Wafer Sizes:

    12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRF
    Vintage: 0Condition: Used
    Last VerifiedOver 30 days ago

    BRUKER

    D8 FABLINE

    verified-listing-icon
    Verified
    CATEGORY
    X-Ray / XRD / XRF
    Last Verified: Over 60 days ago
    listing-photo-aefdbc116fc2442e8fbd467fe8b65764-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    127899


    Wafer Sizes:

    12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    XRD_Bruker
    Configuration
    No Configuration
    OEM Model Description
    The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.
    Documents

    No documents

    Similar Listings
    View All
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRFVintage: 0Condition: UsedLast Verified:Over 30 days ago
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRFVintage: 0Condition: UsedLast Verified:Over 30 days ago
    BRUKER D8 FABLINE

    BRUKER

    D8 FABLINE

    X-Ray / XRD / XRFVintage: 0Condition: UsedLast Verified:Over 60 days ago