Description
Asset Description: THK28002-T - BRUKER D8 FABLINE (MT)- Software Version: 77-2.3A-6A-5A-5A-RR6A CIM: E84, SECS/GEM, GEM300 Process: XRD - BrukerConfiguration
Hardware Configuration System Type Description Quantity Main System D* Fabline (Bruker) 1 Factory Interface FOUP 2 Others Options System LynxEye Detector for secondary side + mount 1 Options System Keyence Laser Triangulation Module 1 for Fast Height Alignment Options System Pattern Recognition Software 1 Options System Wafer Chuck 1 Handler System Standard Automation and SW 1OEM Model Description
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.Documents
No documents
Verified
CATEGORY
X-Ray / XRD / XRF
Last Verified: 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136273
Wafer Sizes:
12"/300mm
Vintage:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Similar Listings
View All
BRUKER
D8 FABLINE
CATEGORY
X-Ray / XRD / XRF
Last Verified: 30 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136273
Wafer Sizes:
12"/300mm
Vintage:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Asset Description: THK28002-T - BRUKER D8 FABLINE (MT)- Software Version: 77-2.3A-6A-5A-5A-RR6A CIM: E84, SECS/GEM, GEM300 Process: XRD - BrukerConfiguration
Hardware Configuration System Type Description Quantity Main System D* Fabline (Bruker) 1 Factory Interface FOUP 2 Others Options System LynxEye Detector for secondary side + mount 1 Options System Keyence Laser Triangulation Module 1 for Fast Height Alignment Options System Pattern Recognition Software 1 Options System Wafer Chuck 1 Handler System Standard Automation and SW 1OEM Model Description
The D8 FABLINE provides fully automated handling of 300mm wafers . It provides a wide spectrum of techniques, such as rapid X-ray reflectivity (XRR), grazing incidence X-ray diffraction (GID), and high-resolution X-ray diffraction (HR-XRD) in order to facilitate advanced process development and control on strained devices and high-K thin films, as well as materials characterization for future generation technology nodes.Documents
No documents