Description
– Type II – with Oxford EDX Detector – Upgraded with: – Back scattered electrons detector – PCI Quartz system – Inca softwareConfiguration
No ConfigurationOEM Model Description
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.Documents
No documents
HITACHI
S-4500
Verified
CATEGORY
SEM
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
34144
Wafer Sizes:
6"/150mm
Vintage:
1996
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Logistics Support
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Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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HITACHI
S-4500
Verified
CATEGORY
SEM
Last Verified: 22 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
34144
Wafer Sizes:
6"/150mm
Vintage:
1996
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
– Type II – with Oxford EDX Detector – Upgraded with: – Back scattered electrons detector – PCI Quartz system – Inca softwareConfiguration
No ConfigurationOEM Model Description
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.Documents
No documents