Description
Hitachi S-4500 , Scanning electron microscope with EDX detector Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50–500,000x, cathode (cold field emission), accelerating voltage 0.5–30 kV, manual sample adjustment in X, Y, and Z axes, Centaurus BSE detector, Bruker X-Flash 5030 EDX detector, Including accessories, consisting of: 1 PC with Bruker Esprit 2.2 image processing software, 1 24-inch monitor, 1 signal processing unit (Bruker), 1 BSE detector controller, 2 high-voltage devices, 2 rotary oil pumps, 1 Van der Heijden heater exchanger, and various sample holders, tiltable by 45°Configuration
No ConfigurationOEM Model Description
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.Documents
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HITACHI
S-4500
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
114675
Wafer Sizes:
Unknown
Vintage:
1995
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Hitachi S-4500 , Scanning electron microscope with EDX detector Magnification 1.5 Nm at 15 kV/4 Nm at 1 kV, magnification 50–500,000x, cathode (cold field emission), accelerating voltage 0.5–30 kV, manual sample adjustment in X, Y, and Z axes, Centaurus BSE detector, Bruker X-Flash 5030 EDX detector, Including accessories, consisting of: 1 PC with Bruker Esprit 2.2 image processing software, 1 24-inch monitor, 1 signal processing unit (Bruker), 1 BSE detector controller, 2 high-voltage devices, 2 rotary oil pumps, 1 Van der Heijden heater exchanger, and various sample holders, tiltable by 45°Configuration
No ConfigurationOEM Model Description
The S-4500 with a semi-in-lens type objective lens and cold field emission electron source suited to high resolution microscopy that was well received in the market.Documents
No documents