Description
No descriptionConfiguration
Adjustable beam energy from 100 eV to 30 keV Short working distance; as low as 8.5 mm High probe current (up to 20 nA) with high stability; better than 0.2% / hour Several detectors: Secondary electron (SE) detector for typical SEM imaging In-Lens SE detector for topographic imaging Backscattered electron detector (BSE) for Z-contrast imaging Variable pressure secondary electron detector (VPSE) for imaging in a partially pressurized environment; 1-133 Pa Transmitted electron detector (Note: The transmission detector is currently out of service)OEM Model Description
The SUPRA® series with the GEMINI® field emission column has excellent low voltage imaging capabilities. Low voltage imaging with low dose energy avoids surface damaging of delicate biological samples. The efficient signal collection and the high contrast dynamic range of the GEMINI® column is particularly useful for low contrast biological samples. With the VP (variable pressure) mode on the SUPRA® 40VP or SUPRA® 55VP non-conducting biological samples can be imaged without prior preparation saving time and avoiding possible artefacts introduced with specimen preparation like drying, fixation and conductive coating. Another major application for biological specimens or colloid chemistry is cryo-FE-SEM. The SUPRA® range has a large cryo port for adaptation of cryo systems on the chamber or a cryo shuttle with offchamber cryo preparation. With the SUPRA® superb high resolution imaging capabilities it is now possible to image details previously only seen with replicas in the TEM.Documents
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ZEISS / CARL ZEISS
SUPRA 40VP
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
96859
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
Available
ZEISS / CARL ZEISS
SUPRA 40VP
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
96859
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Adjustable beam energy from 100 eV to 30 keV Short working distance; as low as 8.5 mm High probe current (up to 20 nA) with high stability; better than 0.2% / hour Several detectors: Secondary electron (SE) detector for typical SEM imaging In-Lens SE detector for topographic imaging Backscattered electron detector (BSE) for Z-contrast imaging Variable pressure secondary electron detector (VPSE) for imaging in a partially pressurized environment; 1-133 Pa Transmitted electron detector (Note: The transmission detector is currently out of service)OEM Model Description
The SUPRA® series with the GEMINI® field emission column has excellent low voltage imaging capabilities. Low voltage imaging with low dose energy avoids surface damaging of delicate biological samples. The efficient signal collection and the high contrast dynamic range of the GEMINI® column is particularly useful for low contrast biological samples. With the VP (variable pressure) mode on the SUPRA® 40VP or SUPRA® 55VP non-conducting biological samples can be imaged without prior preparation saving time and avoiding possible artefacts introduced with specimen preparation like drying, fixation and conductive coating. Another major application for biological specimens or colloid chemistry is cryo-FE-SEM. The SUPRA® range has a large cryo port for adaptation of cryo systems on the chamber or a cryo shuttle with offchamber cryo preparation. With the SUPRA® superb high resolution imaging capabilities it is now possible to image details previously only seen with replicas in the TEM.Documents
No documents