Description
It is a 200kV spherical aberration-corrected transmission electron microscope designed for ultra-high resolution and low voltage imaging. It enables sub-angstrom level atomic observations in materials science, semiconductor and soft matter research, while minimizing beam damage. Hitachi HD-2700 Scanning Transmission Electron Microscope EDS Spectrometer (Energy-Dispersive X-ray Spectrometer) Annular Dark-Field (ADF) Detector Bright-Field (BF) Detector Secondary Electron (SE) Detector (enables atomic-resolution SEM imaging) Sample Stage / Holders MEMS-based In-situ Heating / Biasing Holder Double-Tilt Holder Plan-view Holder Hitachi Focused Ion Beam (FIB) Compatible HolderConfiguration
No ConfigurationOEM Model Description
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.Documents
No documents
HITACHI
HD-2700
CATEGORY
SEM / FIB
Last Verified: 18 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
151852
Wafer Sizes:
Unknown
Vintage:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
It is a 200kV spherical aberration-corrected transmission electron microscope designed for ultra-high resolution and low voltage imaging. It enables sub-angstrom level atomic observations in materials science, semiconductor and soft matter research, while minimizing beam damage. Hitachi HD-2700 Scanning Transmission Electron Microscope EDS Spectrometer (Energy-Dispersive X-ray Spectrometer) Annular Dark-Field (ADF) Detector Bright-Field (BF) Detector Secondary Electron (SE) Detector (enables atomic-resolution SEM imaging) Sample Stage / Holders MEMS-based In-situ Heating / Biasing Holder Double-Tilt Holder Plan-view Holder Hitachi Focused Ion Beam (FIB) Compatible HolderConfiguration
No ConfigurationOEM Model Description
The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.Documents
No documents