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HITACHI HD-2700
    Description
    REVIEW SEM
    Configuration
    HD2700-B
    OEM Model Description
    The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.
    Documents

    No documents

    HITACHI

    HD-2700

    verified-listing-icon

    Verified

    CATEGORY
    SEM / FIB

    Last Verified: 3 days ago

    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    82630

    Wafer Sizes:

    Unknown

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    HITACHI HD-2700

    HITACHI

    HD-2700

    SEM / FIB
    Vintage: 2010Condition: Used
    Last Verified3 days ago

    HITACHI

    HD-2700

    verified-listing-icon
    Verified
    CATEGORY
    SEM / FIB
    Last Verified: 3 days ago
    listing-photo-142cdf539b294c46a909c049f3da6dd9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    82630

    Wafer Sizes:

    Unknown

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    REVIEW SEM
    Configuration
    HD2700-B
    OEM Model Description
    The HD-2700 is an 80-200 kV field-emission-gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of a specimen can be imaged simultaneously. With the option for a probe-forming aberration corrector, ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user's effort in doing aberration correction. Large solid-angle EDS* and atomic-spatial-resolution EDS* and EELS spectrum imaging* are enabled.
    Documents

    No documents

    Similar Listings
    View All
    HITACHI HD-2700

    HITACHI

    HD-2700

    SEM / FIBVintage: 2010Condition: UsedLast Verified:3 days ago