Description
Scanning Electron Microscope in‑lens cold field‑emission SEM designed for ultra‑high‑resolution imaging and advanced STEM analysis Good vacuum, the electron beam aligns properly, and the system is able to generate stable imaging. Core electron‑optical functions are operational. Known Issues: The sample holder is currently stuck in the main chamber, preventing sample exchange. The system powers on and images, but the stage cannot be reloaded until the holder is released. This issue may require mechanical intervention, vacuum cycling, or vendor serviceConfiguration
Cold field‑emission electron gun — high brightness and stable probe performance Accelerating voltage range: 0.5–30 kV In‑lens objective design — optimized for sub‑nanometer resolution SE/BSE mixed‑signal detector — blended contrast for surface and material imaging BF/DF Duo‑STEM detector — bright‑field and dark‑field STEM modes Magnification range: ×60 to ×2,000,000 Dry vacuum system — oil‑free, stable long‑term operation EDS compatible — supports standard SDD detectors Specimen size capacity: Plan‑view: 5.0 × 9.5 × 3.8 mm Cross‑section: 2.0 × 6.5 × 5.0 mmOEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.Documents
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HITACHI
S-5500
CATEGORY
SEM / FIB
Last Verified: 6 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
149108
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Scanning Electron Microscope in‑lens cold field‑emission SEM designed for ultra‑high‑resolution imaging and advanced STEM analysis Good vacuum, the electron beam aligns properly, and the system is able to generate stable imaging. Core electron‑optical functions are operational. Known Issues: The sample holder is currently stuck in the main chamber, preventing sample exchange. The system powers on and images, but the stage cannot be reloaded until the holder is released. This issue may require mechanical intervention, vacuum cycling, or vendor serviceConfiguration
Cold field‑emission electron gun — high brightness and stable probe performance Accelerating voltage range: 0.5–30 kV In‑lens objective design — optimized for sub‑nanometer resolution SE/BSE mixed‑signal detector — blended contrast for surface and material imaging BF/DF Duo‑STEM detector — bright‑field and dark‑field STEM modes Magnification range: ×60 to ×2,000,000 Dry vacuum system — oil‑free, stable long‑term operation EDS compatible — supports standard SDD detectors Specimen size capacity: Plan‑view: 5.0 × 9.5 × 3.8 mm Cross‑section: 2.0 × 6.5 × 5.0 mmOEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.Documents
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