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HITACHI S-5500
  • HITACHI S-5500
Description
In-lens FE SEM
Configuration
No Configuration
OEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.
Documents

No documents

CATEGORY
SEM / FIB

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

115008


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

HITACHI

S-5500

verified-listing-icon
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
listing-photo-54f4084202f948229e57e5110e85c92a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/54f4084202f948229e57e5110e85c92a/e94b8c4b17124c4b984a2d2db3ea2efb_1_mw.png
Key Item Details

Condition:

Used


Operational Status:

Unknown


Product ID:

115008


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
In-lens FE SEM
Configuration
No Configuration
OEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.
Documents

No documents