Description
ANALYTICAL EQUIPMENTConfiguration
Operating System: Windows XP Pro Optional Specimen Holders: Cross Section holder Quartz PCI Water Recirculator: SMC Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample size: • Bulk - 5.0mm x 9.5mm x 3.5mmH (max) • Cross-Section: 2.0mm x 6.0mm x 5.0mmH (max)OEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.Documents
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HITACHI
S-5500
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
43497
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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HITACHI
S-5500
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Refurbished
Operational Status:
Unknown
Product ID:
43497
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
ANALYTICAL EQUIPMENTConfiguration
Operating System: Windows XP Pro Optional Specimen Holders: Cross Section holder Quartz PCI Water Recirculator: SMC Secondary Electron image resolution: 0.4nm at 30kV and 1.6nm at 1kV Specimen Stage Stage Traverse: X: +3.5mm, Y: +2.0mm, Z:+0.3mm, T: +40 degrees Sample size: • Bulk - 5.0mm x 9.5mm x 3.5mmH (max) • Cross-Section: 2.0mm x 6.0mm x 5.0mmH (max)OEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.Documents
No documents