Description
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Vertical resolution of a few angstrom over a wide area (5 X 5 mm2)OEM Model Description
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.Documents
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WYKO / VEECO
NT2000
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
98586
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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WYKO / VEECO
NT2000
CATEGORY
Profiler
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
98586
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
Vertical resolution of a few angstrom over a wide area (5 X 5 mm2)OEM Model Description
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.Documents
No documents