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WYKO / VEECO NT2000
  • WYKO / VEECO NT2000
  • WYKO / VEECO NT2000
  • WYKO / VEECO NT2000
Description
Optical Profiler
Configuration
No Configuration
OEM Model Description
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.
Documents

No documents

CATEGORY
Profiler

Last Verified: Over 60 days ago

Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

104949


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

WYKO / VEECO

NT2000

verified-listing-icon
Verified
CATEGORY
Profiler
Last Verified: Over 60 days ago
listing-photo-06a3abf16f2642ccb8757d9f5df02c4f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
Key Item Details

Condition:

Refurbished


Operational Status:

Unknown


Product ID:

104949


Wafer Sizes:

Unknown


Vintage:

Unknown


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Optical Profiler
Configuration
No Configuration
OEM Model Description
The WYKO NT2000 is an advanced optical profiler that provides ultra-precise 3-D analyses of surfaces for process control. It can measure heights from 0.1 nm to several millimeters, with vertical resolution as low as 0.1 nm. The fully automated system provides submicron precision and fast throughput, while non-automated versions are available for R&D applications. The instrument can accurately measure a wide variety of materials and is ideally suited for R&D investigation, quality inspection, failure analysis, and in-line production measurements.
Documents

No documents