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TEL / TOKYO ELECTRON P-12XL
    Description
    TEL P12XL prober dual port Main System: Prober (QTY 1) Factory Interface: FOUP (QTY 2) Handler System: Pincette (QTY 2)
    Configuration
    Software Version: Rby00-R014.083Z CIM: RS232 Process: Test
    OEM Model Description
    The P-12XL Prober is a next-generation prober developed by TEL. It builds on the success of the P-8XL and shares the same interactive LCD Touch Panel Screen and On-axis Alignment. Additionally, it incorporates a FOUP loader, increased Z force, and higher accuracy, making it capable of tackling tomorrow’s technological challenges. The P-12XL has even been featured in the Semiconductor International article “Fabrication of the First Transistors on 300mm Wafers.
    Documents
    verified-listing-icon

    Verified

    CATEGORY
    Probers

    Last Verified: Yesterday

    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Down


    Product ID:

    136605


    Wafer Sizes:

    Unknown


    Vintage:

    2002


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    TEL / TOKYO ELECTRON P-12XL

    TEL / TOKYO ELECTRON

    P-12XL

    Probers
    Vintage: 2002Condition: Used
    Last VerifiedYesterday

    TEL / TOKYO ELECTRON

    P-12XL

    verified-listing-icon
    Verified
    CATEGORY
    Probers
    Last Verified: Yesterday
    listing-photo-c2fbd67d1bc7494d931bcc7f16a0d05b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89075/c2fbd67d1bc7494d931bcc7f16a0d05b/333f2d2750084942984b1457195c91ad_c35bc4ca534e44b49788feb64ed80130_mw.jpeg
    listing-photo-c2fbd67d1bc7494d931bcc7f16a0d05b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89075/c2fbd67d1bc7494d931bcc7f16a0d05b/fbb344713d644c5a8a6a87afaa8f4a85_32042ee2db1b4dfbb4f8dccb3eb193e2_mw.jpeg
    listing-photo-c2fbd67d1bc7494d931bcc7f16a0d05b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89075/c2fbd67d1bc7494d931bcc7f16a0d05b/401bfdae82c0464ebfe618e0de0c1d2c_1ddcbbbcbadb46b28087fdde788876b0_mw.jpeg
    listing-photo-c2fbd67d1bc7494d931bcc7f16a0d05b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89075/c2fbd67d1bc7494d931bcc7f16a0d05b/ab864d13854f4c6580ec83112f9e41b7_b75ab3a18da24dd39e01b7942386ffd3_mw.jpeg
    listing-photo-c2fbd67d1bc7494d931bcc7f16a0d05b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89075/c2fbd67d1bc7494d931bcc7f16a0d05b/95660f0c42c24810894556a1c7423ab7_588bd9331cfe4a62b11966f3e2c7f38c1201a_mw.jpeg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Installed / Down


    Product ID:

    136605


    Wafer Sizes:

    Unknown


    Vintage:

    2002


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    TEL P12XL prober dual port Main System: Prober (QTY 1) Factory Interface: FOUP (QTY 2) Handler System: Pincette (QTY 2)
    Configuration
    Software Version: Rby00-R014.083Z CIM: RS232 Process: Test
    OEM Model Description
    The P-12XL Prober is a next-generation prober developed by TEL. It builds on the success of the P-8XL and shares the same interactive LCD Touch Panel Screen and On-axis Alignment. Additionally, it incorporates a FOUP loader, increased Z force, and higher accuracy, making it capable of tackling tomorrow’s technological challenges. The P-12XL has even been featured in the Semiconductor International article “Fabrication of the First Transistors on 300mm Wafers.
    Documents
    Similar Listings
    View All
    TEL / TOKYO ELECTRON P-12XL

    TEL / TOKYO ELECTRON

    P-12XL

    ProbersVintage: 2002Condition: UsedLast Verified:Yesterday
    TEL / TOKYO ELECTRON P-12XL

    TEL / TOKYO ELECTRON

    P-12XL

    ProbersVintage: 2002Condition: UsedLast Verified:Yesterday
    TEL / TOKYO ELECTRON P-12XL

    TEL / TOKYO ELECTRON

    P-12XL

    ProbersVintage: 2002Condition: UsedLast Verified:Yesterday