FORM FACTOR / CASCADE MICROTECH / FRT S300

Description

Engineering Wafer Prober

Configuration

Confirm Standard Configuration includes: Stage:12" Travel of Stage:301 mm x 301 mm Theta travel:± 7.5 degrees Microscope spec:Optem A-Zoom Options: Head Stage:NA Test Head Connection Jig:NA Ambient/Room Temp Chuck:-55°C to 200°C Heater ( Yes/No ):Yes (Thermal Controller and Chiller) GP-IB Interface:Yes RS232 Interface:NA Light Source:Yes Table:NA Manuals:NA Mechnical Tester I/F, Tester Model:NA Vacuum:NA DUT sizes:NA Tester Type (Used With):NA

OEM Model Description

Supports wafer sizes and shards from 0.5 in. (1 mm) to up to 12 in. (300mm) Semi-Automatic Probe Station

Documents

No documents

FORM FACTOR / CASCADE MICROTECH / FRT

S300

Verified

Probers

Last Verified: Over 30 days ago

Key Item Details

Condition:

Used

Operational Status:

Unknown

Product ID:

130034

Wafer Sizes:

8"/200mm

Vintage:

Unknown

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

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