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ACCRETECH / TSK UF3000EX-e
    Description
    No description
    Configuration
    OCR: Yes Wafer specification: -Size: 8"/12" -Thickness: 240~2200um -Die size: 350~76000um Autoloader unit: -300 mm FOUP/ FOSB and 200 mm cassette -Single port Loader Interface: GPIB Chuck: -Nickel plate -Planarity : 15um (20℃≦t ≦50℃) -30um (50℃≦t ≦200℃) -Temperature : 30℃ to 150℃ -Withstand Load : 200kgf Display Unit: 15” color display & touch panel Cleaning Unit: (100 mm x 60mm) 3 block with vacuum type APC function: No Miscellaneous: 1. Touch sensor 2. Ethernet interface 3. Cognex 8200 Docking interface: VLCT/J750 combo Auto hinge: No Probe card holder: No Touch sensor: Yes
    OEM Model Description
    The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.
    Documents

    ACCRETECH / TSK

    UF3000EX-e

    verified-listing-icon

    Verified

    CATEGORY

    Probers
    Last Verified: 22 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    71202


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown

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    ACCRETECH / TSK UF3000EX-e
    ACCRETECH / TSKUF3000EX-eProbers
    Vintage: 0Condition: Used
    Last Verified20 days ago

    ACCRETECH / TSK

    UF3000EX-e

    verified-listing-icon

    Verified

    CATEGORY

    Probers
    Last Verified: 22 days ago
    listing-photo-3e2aba76d3c441629337a0ef84fa1290-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    71202


    Wafer Sizes:

    8"/200mm, 12"/300mm


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    OCR: Yes Wafer specification: -Size: 8"/12" -Thickness: 240~2200um -Die size: 350~76000um Autoloader unit: -300 mm FOUP/ FOSB and 200 mm cassette -Single port Loader Interface: GPIB Chuck: -Nickel plate -Planarity : 15um (20℃≦t ≦50℃) -30um (50℃≦t ≦200℃) -Temperature : 30℃ to 150℃ -Withstand Load : 200kgf Display Unit: 15” color display & touch panel Cleaning Unit: (100 mm x 60mm) 3 block with vacuum type APC function: No Miscellaneous: 1. Touch sensor 2. Ethernet interface 3. Cognex 8200 Docking interface: VLCT/J750 combo Auto hinge: No Probe card holder: No Touch sensor: Yes
    OEM Model Description
    The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.
    Documents
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