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ACCRETECH / TSK UF3000EX-e
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    Probers

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    126847


    Wafer Sizes:

    Unknown


    Vintage:

    2017


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

    UF3000EX-e

    Probers
    Vintage: 0Condition: Used
    Last VerifiedOver 60 days ago

    ACCRETECH / TSK

    UF3000EX-e

    verified-listing-icon
    Verified
    CATEGORY
    Probers
    Last Verified: Over 60 days ago
    listing-photo-08d9bb6436a24420a08212b023fc4964-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77110/08d9bb6436a24420a08212b023fc4964/c60e3cae6c654999aee61dcaf131614b_20230614105924_mw.jpg
    listing-photo-08d9bb6436a24420a08212b023fc4964-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77110/08d9bb6436a24420a08212b023fc4964/28fad631e64947e2aadcee214eae4203_20230614144532_mw.jpg
    listing-photo-08d9bb6436a24420a08212b023fc4964-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77110/08d9bb6436a24420a08212b023fc4964/40567fb21ae649fb82006a620d79f266_20230614144655_mw.jpg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    126847


    Wafer Sizes:

    Unknown


    Vintage:

    2017


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The UF3000EX-e is a fully automatic wafer prober that is also available for numerous special applications. It is uncompromising for throughput, very flexible for application, and has very precise navigation. It uses non-contact measurement and can handle wafers from 200 to 300 mm in diameter, including special types of wafers. The UF3000EX-e features a newly developed XY stage drive unit and a new algorithm for extremely high throughput, an improved Z-platform for the highest probe power, and a 15-inch LCD touch screen for easy operation. It also has an Optical Target Scope (OTS) for very precise measurements of the relative positions of probe cards and chucks, a tri-color 3-level magnifying function for color recording and 3 enhancement levels, and a navigation display function that allows the user to manage each desired wafer point by simply touching the wafer map.
    Documents

    No documents

    Similar Listings
    View All
    ACCRETECH / TSK UF3000EX-e

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    ProbersVintage: 2012Condition: UsedLast Verified:Over 60 days ago
    ACCRETECH / TSK UF3000EX-e

    ACCRETECH / TSK

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    ProbersVintage: 2017Condition: UsedLast Verified:Over 60 days ago