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SENSOFAR PLu NEOX
    Description
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    Configuration
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    OEM Model Description
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
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    SENSOFAR

    PLu NEOX

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    77624


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown

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    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    Metrology
    Vintage: 2011Condition: Used
    Last VerifiedOver 60 days ago

    SENSOFAR

    PLu NEOX

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-5c9985c03af146d9a81d6a84ba2b210a-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    77624


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The PLu neox is the most advanced optical profiler from Sensofar. Based on the successful series of PLu optical surface profilers, the PLu neox covers the broadest range of applications on 3D and thin film metrology due to the combination of confocal scanning, phase shift interferometry, vertical scanning interferometry and spectroscopic reflectometry. This powerful combination allows for fast 2D and 3D analysis of technical surfaces with less than 0.1 nm vertical resolution, the capability to measure steep slopes over 70 degrees on smooth surfaces, and thin film metrology with less than 1 nm of resolution.
    Documents

    No documents

    Similar Listings
    View All
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    MetrologyVintage: 2011Condition: UsedLast Verified: Over 60 days ago
    SENSOFAR PLu NEOX

    SENSOFAR

    PLu NEOX

    MetrologyVintage: 0Condition: UsedLast Verified: Over 60 days ago