Description
Pneumatic Module & HDD MissingConfiguration
No ConfigurationOEM Model Description
The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.Documents
No documents
SEMILAB
MCV 2500
CATEGORY
Metrology
Last Verified: 10 days ago
Key Item Details
Condition:
Parts Tool
Operational Status:
Unknown
Product ID:
146135
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Pneumatic Module & HDD MissingConfiguration
No ConfigurationOEM Model Description
The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.Documents
No documents