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SEMILAB MCV 2500
    Description
    HG-CV System for EPI resistivity measurement
    Configuration
    No Configuration
    OEM Model Description
    The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
    Documents

    No documents

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    115098


    Wafer Sizes:

    12"/300mm


    Vintage:

    2010


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
    View All
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    Metrology
    Vintage: 2010Condition: Used
    Last VerifiedOver 60 days ago

    SEMILAB

    MCV 2500

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 60 days ago
    listing-photo-2d41d3cedad24207bef366e7525f524a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2d41d3cedad24207bef366e7525f524a/20b33548b90f46b5b60d7e6d933a8f04_30000_mw.jpg
    listing-photo-2d41d3cedad24207bef366e7525f524a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2d41d3cedad24207bef366e7525f524a/1b51caf0b1df4f8ba9789b13ceff6386_10000_mw.jpg
    listing-photo-2d41d3cedad24207bef366e7525f524a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2d41d3cedad24207bef366e7525f524a/bad0280d2b1147409ccde16b9b40dddb_20000_mw.jpg
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    115098


    Wafer Sizes:

    12"/300mm


    Vintage:

    2010


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    HG-CV System for EPI resistivity measurement
    Configuration
    No Configuration
    OEM Model Description
    The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
    Documents

    No documents

    Similar Listings
    View All
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    MetrologyVintage: 2010Condition: UsedLast Verified:Over 60 days ago
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    MetrologyVintage: 2010Condition: RefurbishedLast Verified:Over 60 days ago