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SEMILAB MCV 2500
    Description
    HG-CV System for EPI resistivity measurement
    Configuration
    ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance - CV Meter Noise Test (Schottky Diode Test): 1 STD(%) <0.167% - MOS Wafer Area Test : 1 STD(%) <0.1% ■ Capacitance: 0 ~ 2000pF(1MHz), 1 ~ 20,000pF(100KHz) ■ Conductance: 0 ~ 2000μS ■ DC Bias voltage: ± 250V ■ Ramp Rate: 0 ~ 50 V/s continuously variable ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ Stress Voltage: ± 250V ■ CDA: 80~100psi, Nitrogen for sample purge:0~15psi ■ Ambient temperature: 18° - 25°C ± 2°C over 24 hour period
    OEM Model Description
    The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
    Documents

    No documents

    SEMILAB

    MCV 2500

    verified-listing-icon

    Verified

    CATEGORY
    Metrology

    Last Verified: Over 30 days ago

    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    101993

    Wafer Sizes:

    12"/300mm

    Vintage:

    2010

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
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    Transaction Insured by Moov
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    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    Metrology
    Vintage: 2010Condition: Refurbished
    Last VerifiedOver 30 days ago

    SEMILAB

    MCV 2500

    verified-listing-icon
    Verified
    CATEGORY
    Metrology
    Last Verified: Over 30 days ago
    listing-photo-2c14cf9e332b476995f3e4f439e5e4b1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2c14cf9e332b476995f3e4f439e5e4b1/6bff36bcddd1497d991f258e393c84fe_spk3680_mw.jpg
    listing-photo-2c14cf9e332b476995f3e4f439e5e4b1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2c14cf9e332b476995f3e4f439e5e4b1/14cea41983eb47d1af3cb39b7a2ed486_spk3681_mw.jpg
    listing-photo-2c14cf9e332b476995f3e4f439e5e4b1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1987/2c14cf9e332b476995f3e4f439e5e4b1/b666e025a0b8493eb5964dc39ad111b9_spk3682_mw.jpg
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    101993

    Wafer Sizes:

    12"/300mm

    Vintage:

    2010

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    HG-CV System for EPI resistivity measurement
    Configuration
    ■ SSM 52 Capacitance Measurement Unit ■ Motor control unit ■ Pneumatic control Unit ■ PC System ■ PROCAP software ■ Performance - CV Meter Noise Test (Schottky Diode Test): 1 STD(%) <0.167% - MOS Wafer Area Test : 1 STD(%) <0.1% ■ Capacitance: 0 ~ 2000pF(1MHz), 1 ~ 20,000pF(100KHz) ■ Conductance: 0 ~ 2000μS ■ DC Bias voltage: ± 250V ■ Ramp Rate: 0 ~ 50 V/s continuously variable ■ Drive Signal Frequency at 1Mhz voltage=15mV rms ■ Stress Voltage: ± 250V ■ CDA: 80~100psi, Nitrogen for sample purge:0~15psi ■ Ambient temperature: 18° - 25°C ± 2°C over 24 hour period
    OEM Model Description
    The MCV automatic mapping systems provide a Mercury C-V measurement for non-patterned wafers used in epitaxial silicon production and front-end semiconductor processing.
    Documents

    No documents

    Similar Listings
    View All
    SEMILAB MCV 2500

    SEMILAB

    MCV 2500

    MetrologyVintage: 2010Condition: RefurbishedLast Verified: Over 30 days ago