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KLA RS55
    Description
    Auto OmniMap Resistivity Tester It's Complete but in some error as follows *Stage reset error *SBC errors
    Configuration
    No Configuration
    OEM Model Description
    The Prometrix RS55 is a four-point probe resistivity mapping system manufactured by KLA-Tencor. It has a temperature compensation configuration (RS55/TC) and can handle wafers up to 8"/200mm in size. It has manual wafer handling and can provide contour maps, 3-D plots, and diameter scans. It can also compensate sheet resistance measurements against ambient temperature and materials.
    Documents

    No documents

    KLA

    RS55

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    70435


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown

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    KLA RS55
    KLARS55Metrology
    Vintage: 2001Condition: Used
    Last VerifiedOver 60 days ago

    KLA

    RS55

    verified-listing-icon

    Verified

    CATEGORY

    Metrology
    Last Verified: Over 60 days ago
    listing-photo-b7a957fde6e84b589c67865fb59ad0c1-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    70435


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    Auto OmniMap Resistivity Tester It's Complete but in some error as follows *Stage reset error *SBC errors
    Configuration
    No Configuration
    OEM Model Description
    The Prometrix RS55 is a four-point probe resistivity mapping system manufactured by KLA-Tencor. It has a temperature compensation configuration (RS55/TC) and can handle wafers up to 8"/200mm in size. It has manual wafer handling and can provide contour maps, 3-D plots, and diameter scans. It can also compensate sheet resistance measurements against ambient temperature and materials.
    Documents

    No documents

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    View All
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    KLA RS55
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