Description
Filmetrics F10-RT Thin Film Analyzer: NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. The F10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Software Version 9.3.1.0, Customer must supply their own computer. Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.Configuration
No ConfigurationOEM Model Description
The F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click. For a fraction of the price of legacy reflectometry systems, users can measure min/max and color. Thickness Range: 15nm - 70µm Wavelength Range: 380-1050nmDocuments
No documents
KLA / FILMETRICS
F10-RT
Verified
CATEGORY
Metrology
Last Verified: 4 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
64310
Wafer Sizes:
Unknown
Vintage:
2019
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / FILMETRICS
F10-RT
CATEGORY
Metrology
Last Verified: 4 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
64310
Wafer Sizes:
Unknown
Vintage:
2019
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Filmetrics F10-RT Thin Film Analyzer: NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. The F10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Software Version 9.3.1.0, Customer must supply their own computer. Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.Configuration
No ConfigurationOEM Model Description
The F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click. For a fraction of the price of legacy reflectometry systems, users can measure min/max and color. Thickness Range: 15nm - 70µm Wavelength Range: 380-1050nmDocuments
No documents