The F10-RT reflectometer captures reflectance and transmittance spectra with a single mouse-click. For a fraction of the price of legacy reflectometry systems, users can measure min/max and color.
Thickness Range: 15nm - 70µm
Wavelength Range: 380-1050nm

KLA Corporation has acquired Filmetrics, Inc. and extends KLA’s instrument solutions with the thin film and Profilm3D products. 

The World's Sales Leader in Thin-Film Thickness Measurement
More companies count on Filmetrics® for affordable thin-film thickness measurements than on anyone else. Makers of cell phones, eyeglasses, liquid-crystal displays, and hundreds of other products appreciate that our devices are easy-to-use, cost less, and are backed with unmatched support. In fact, our customers show us new uses for our thin-film thickness measurement tools every day!

KLA / FILMETRICS

F10-RT

Filmetrics F10-RT Thin Film Analyzer:
NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. The F10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. 

Software Version 9.3.1.0, Customer must supply their own computer. 
Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.

F10-RT

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