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LAM RESEARCH / NOVELLUS INOVA NExT
    Description
    TFM_TiN-HM Dep
    Configuration
    TFM_TiN-HM Dep
    OEM Model Description
    The INOVA NExT, a 300mm metallization system designed to deposit highly conformal copper barrier-seed films at 45 nanometers and beyond. On the INOVA NExT, the single target HCM technology has been extended to the 45 nanometer node; the system also features an integrated ion-induced atomic layer deposition (iALD) module to deposit tantalum nitride (TaN) barrier films below 45 nanometers.
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    LAM RESEARCH / NOVELLUS

    INOVA NExT

    verified-listing-icon

    Verified

    CATEGORY

    Deposition
    Last Verified: Over 60 days ago
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    49104


    Wafer Sizes:

    12"/300mm


    Vintage:

    2013

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    LAM RESEARCH / NOVELLUS INOVA NExT
    LAM RESEARCH / NOVELLUSINOVA NExTDeposition
    Vintage: 2013Condition: Used
    Last VerifiedOver 60 days ago

    LAM RESEARCH / NOVELLUS

    INOVA NExT

    verified-listing-icon

    Verified

    CATEGORY

    Deposition
    Last Verified: Over 60 days ago
    listing-photo-2afbb2dc40a848f3825daed5f69a6e92-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    49104


    Wafer Sizes:

    12"/300mm


    Vintage:

    2013


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    TFM_TiN-HM Dep
    Configuration
    TFM_TiN-HM Dep
    OEM Model Description
    The INOVA NExT, a 300mm metallization system designed to deposit highly conformal copper barrier-seed films at 45 nanometers and beyond. On the INOVA NExT, the single target HCM technology has been extended to the 45 nanometer node; the system also features an integrated ion-induced atomic layer deposition (iALD) module to deposit tantalum nitride (TaN) barrier films below 45 nanometers.
    Documents

    No documents

    Similar Listings
    View All
    LAM RESEARCH / NOVELLUS INOVA NExT
    LAM RESEARCH / NOVELLUS
    INOVA NExT
    DepositionVintage: 2013Condition: UsedLast Verified: Over 60 days ago
    LAM RESEARCH / NOVELLUS INOVA NExT
    LAM RESEARCH / NOVELLUS
    INOVA NExT
    DepositionVintage: 2013Condition: UsedLast Verified: Over 60 days ago
    LAM RESEARCH / NOVELLUS INOVA NExT
    LAM RESEARCH / NOVELLUS
    INOVA NExT
    DepositionVintage: 2013Condition: UsedLast Verified: Yesterday