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KLA 2401
    Description
    No description
    Configuration
    - SMIF TYPE - Remove from production 5 years ago - Stored in humidity and temperature controlled area - Part removed is the FFU (Fan Filtering unit)
    OEM Model Description
    The 2401 Automated Macro Defect Inspection System is a product by KLA-Tencor that replaces manual bright light macro defect inspection performed by operators. It provides automated detection, classification, and reporting of all yield-critical macro after-develop inspection defect types, including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback. With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing for quick and accurate disposition decisions, reducing scrap and preventing further investment in low-yielding wafers.
    Documents

    No documents

    KLA

    2401

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    31623

    Wafer Sizes:

    Unknown

    Vintage:

    2000

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    KLA 2401
    KLA2401Defect Inspection
    Vintage: 2000Condition: Used
    Last VerifiedOver 30 days ago

    KLA

    2401

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 30 days ago
    listing-photo-2ac8818f047a442889eca79770818743-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/2ac8818f047a442889eca79770818743/02b5c63e63214301a65b3b367b93f010_fcb2ac41968a4f5caa2a333ac6d29ba645005c_mw.jpeg
    listing-photo-2ac8818f047a442889eca79770818743-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/2ac8818f047a442889eca79770818743/24723701a8bf4f03a5bf63afb533e164_cdfa29d61bce403eb4459f8a2bc24a9645005c_mw.jpeg
    listing-photo-2ac8818f047a442889eca79770818743-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/2ac8818f047a442889eca79770818743/9284600a91ac46f69ad2cf8dcf746c23_1c227cb0872148c99a375bc63831c3d045005c_mw.jpeg
    listing-photo-2ac8818f047a442889eca79770818743-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/2046/2ac8818f047a442889eca79770818743/ea470f68e9774adabc584b7738060bbc_92b790c6cd3f45c689e4074af3d9ab9145005c_mw.jpeg
    Key Item Details
    Condition:

    Used

    Operational Status:

    Unknown

    Product ID:

    31623

    Wafer Sizes:

    Unknown

    Vintage:

    2000

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    - SMIF TYPE - Remove from production 5 years ago - Stored in humidity and temperature controlled area - Part removed is the FFU (Fan Filtering unit)
    OEM Model Description
    The 2401 Automated Macro Defect Inspection System is a product by KLA-Tencor that replaces manual bright light macro defect inspection performed by operators. It provides automated detection, classification, and reporting of all yield-critical macro after-develop inspection defect types, including hotspots, scratches, large particles, extra and missing resist, unexposed fields, striations, developer spots and splashback. With sensitivity superior to that of operators, the 2401 Automated Macro Defect Inspection System detects defects reliably and repeatably, allowing for quick and accurate disposition decisions, reducing scrap and preventing further investment in low-yielding wafers.
    Documents

    No documents

    Similar Listings
    View All
    KLA 2401
    KLA
    2401
    Defect InspectionVintage: 2000Condition: UsedLast Verified: Over 30 days ago