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KLA AIT UV
    Description
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    Configuration
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    OEM Model Description
    AIT UV™ is a high-throughput, high-sensitivity wafer inspection product that uses Dual AOD technology to increase scan rate, UV laser illumination for increased sensitivity, and advanced detection algorithms for improved defect capture. It also features real-time Adaptive Mode™ technology, three-channel double-darkfield optics, MultiSpot™ illumination, and Inline Automatic Defect Classification (iADC) for faster results. It is part of KLA-Tencor’s AIT family of inspection systems and is designed for 300-mm inspection and excursion monitoring at 100-nm design rules and below.
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    KLA

    AIT UV

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    87797

    Wafer Sizes:

    8"/200mm, 12"/300mm

    Vintage:

    Unknown

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    Money Back Guarantee
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    Transaction Insured by Moov
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    Refurbishment Services
    Available
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    KLA

    AIT UV

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-6656373576e346da924a6c3a705cc68d-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    87797

    Wafer Sizes:

    8"/200mm, 12"/300mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    AIT UV™ is a high-throughput, high-sensitivity wafer inspection product that uses Dual AOD technology to increase scan rate, UV laser illumination for increased sensitivity, and advanced detection algorithms for improved defect capture. It also features real-time Adaptive Mode™ technology, three-channel double-darkfield optics, MultiSpot™ illumination, and Inline Automatic Defect Classification (iADC) for faster results. It is part of KLA-Tencor’s AIT family of inspection systems and is designed for 300-mm inspection and excursion monitoring at 100-nm design rules and below.
    Documents

    No documents

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    View All
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    Defect InspectionVintage: 2003Condition: UsedLast Verified: Over 60 days ago
    KLA AIT UV
    KLA
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    Defect InspectionVintage: 2008Condition: UsedLast Verified: Over 60 days ago