AIT UV
Category
Defect InspectionOverview
AIT UV™ is a high-throughput, high-sensitivity wafer inspection product that uses Dual AOD technology to increase scan rate, UV laser illumination for increased sensitivity, and advanced detection algorithms for improved defect capture. It also features real-time Adaptive Mode™ technology, three-channel double-darkfield optics, MultiSpot™ illumination, and Inline Automatic Defect Classification (iADC) for faster results. It is part of KLA-Tencor’s AIT family of inspection systems and is designed for 300-mm inspection and excursion monitoring at 100-nm design rules and below.
Active Listings
4
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
- AIT UVDefect InspectionVintage: 2008Condition: UsedLast VerifiedOver 60 days ago
- AIT UVDefect InspectionVintage: 2003Condition: UsedLast VerifiedOver 60 days ago
- AIT UVDefect InspectionVintage: Condition: UsedLast Verified14 days ago
- AIT UVDefect InspectionVintage: Condition: RefurbishedLast VerifiedOver 60 days ago