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APPLIED MATERIALS (AMAT) SEMVISION G3 LITE
    Description
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    Configuration
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    OEM Model Description
    The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.
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    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    87260

    Wafer Sizes:

    8"/200mm, 12"/300mm

    Vintage:

    Unknown

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    Logistics Support
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    Money Back Guarantee
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    Transaction Insured by Moov
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    APPLIED MATERIALS (AMAT) SEMVISION G3 LITE
    APPLIED MATERIALS (AMAT)SEMVISION G3 LITEDefect Inspection
    Vintage: 0Condition: Refurbished
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    SEMVISION G3 LITE

    verified-listing-icon

    Verified

    CATEGORY

    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-76fdc01b869d4304b27d83c7e174a4e8-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details
    Condition:

    Refurbished

    Operational Status:

    Unknown

    Product ID:

    87260

    Wafer Sizes:

    8"/200mm, 12"/300mm

    Vintage:

    Unknown

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G3 LITE
    APPLIED MATERIALS (AMAT)
    SEMVISION G3 LITE
    Defect InspectionVintage: 0Condition: RefurbishedLast Verified: Over 60 days ago