SEMVISION G3 LITE
Category
Defect InspectionOverview
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.
Active Listings
5
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect InspectionVintage: 2007Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect InspectionVintage: 2007Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect InspectionVintage: 2007Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
