APPLIED MATERIALS (AMAT) SEMVISION G3 LITE

Description

No description

Configuration

SEMVision G3 LITE TDK Handler FOUP x2 OM Controller

OEM Model Description

The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.