Description
Asset Description 461624.86 Software Version 5.3.10 CIM 10.93.22.120 Process Defect review semConfiguration
Hardware Configuration System Type Description Quantity Options System Main System SEMVision G3 LITE 1 Handler System TDK 1 Factory Interface FOUP 2 Others Electronic Rack 1 Description Quantity OM Controller 1OEM Model Description
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.Documents
No documents
CATEGORY
Defect Inspection
Last Verified: 9 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
146738
Wafer Sizes:
12"/300mm
Vintage:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
SEMVISION G3 LITE
CATEGORY
Defect Inspection
Last Verified: 9 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Running
Product ID:
146738
Wafer Sizes:
12"/300mm
Vintage:
2007
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Asset Description 461624.86 Software Version 5.3.10 CIM 10.93.22.120 Process Defect review semConfiguration
Hardware Configuration System Type Description Quantity Options System Main System SEMVision G3 LITE 1 Handler System TDK 1 Factory Interface FOUP 2 Others Electronic Rack 1 Description Quantity OM Controller 1OEM Model Description
The SEMVision G3 Lite is a part of Applied Materials’ SEMVision G3 family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 1,800 defects per hour.Documents
No documents