Description
Metrology / inspection systemConfiguration
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEM Model Description
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.Documents
No documents
CATEGORY
Defect Inspection
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
154786
Wafer Sizes:
12"/300mm
Vintage:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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APPLIED MATERIALS (AMAT)
SEMVISION G2
CATEGORY
Defect Inspection
Last Verified: 5 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
154786
Wafer Sizes:
12"/300mm
Vintage:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Metrology / inspection systemConfiguration
SEMVision G2 Robot Handler (Qty 2) FOUP Factory Interface Electronic Rack Process: Defect review sem Software Version: 5.4.500 CIM: SEC/GEMOEM Model Description
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.Documents
No documents