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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) SEMVISION G2
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
    Documents

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    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon

    Verified

    CATEGORY
    Defect Inspection

    Last Verified: Over 60 days ago

    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    108850


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Similar Listings
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    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection
    Vintage: 2004Condition: Used
    Last VerifiedOver 60 days ago

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon
    Verified
    CATEGORY
    Defect Inspection
    Last Verified: Over 60 days ago
    listing-photo-4e70c292ed7c4078871490d84029ee65-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    Key Item Details

    Condition:

    Used


    Operational Status:

    Unknown


    Product ID:

    108850


    Wafer Sizes:

    Unknown


    Vintage:

    Unknown


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    Description
    No description
    Configuration
    No Configuration
    OEM Model Description
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
    Documents

    No documents

    Similar Listings
    View All
    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect InspectionVintage: 2004Condition: UsedLast Verified:Over 60 days ago
    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect InspectionVintage: 0Condition: UsedLast Verified:Over 60 days ago