Skip to main content

SEMVISION G2

Overview

The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.

Active Listings

1

Services

Inspection, Insurance, Appraisal, Logistics

Top Listings

Have one like this?
List it with Moov and find the perfect buyer in no time at all.