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SEMVISION G2
Category
Defect InspectionOverview
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
Active Listings
3
Services
Inspection, Insurance, Appraisal, Logistics
Top Listings
APPLIED MATERIALS (AMAT)
SEMVISION G2
Defect InspectionVintage: 2004Condition: UsedLast VerifiedOver 60 days agoAPPLIED MATERIALS (AMAT)
SEMVISION G2
Defect InspectionVintage: Condition: RefurbishedLast VerifiedOver 60 days ago- PREFERREDSELLER
APPLIED MATERIALS (AMAT)
SEMVISION G2
Defect InspectionVintage: Condition: UsedLast VerifiedOver 60 days ago
