Description
Known issues: -Some Flickering on image of chamberscope.Configuration
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -6" stage and loadlock. 6” wafer loading thru the loadlock is possible -Field 6” loadlock and stage -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEM Model Description
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ZEISS / CARL ZEISS
1560
Verified
CATEGORY
SEM
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
102936
Wafer Sizes:
6"/150mm
Vintage:
1999
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Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
1560
Verified
CATEGORY
SEM
Last Verified: 9 days ago
Key Item Details
Condition:
Used
Operational Status:
Installed / Idle
Product ID:
102936
Wafer Sizes:
6"/150mm
Vintage:
1999
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
Known issues: -Some Flickering on image of chamberscope.Configuration
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -6" stage and loadlock. 6” wafer loading thru the loadlock is possible -Field 6” loadlock and stage -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.OEM Model Description
None ProvidedDocuments
No documents