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Description
-Comments: System decommissioned in July 2024 from operational. New tip is required.Configuration
-Windows OS: W10 -Software Version: SmartSEM (v6) -Source Type: TFE -Variable Pressure: Yes -Primary Pump: Turbo -Detector 1: Everheart Thornley Secondary Electron Detector -Detector 2: Inlens detectorOEM Model Description
The SUPRA® 55VP is a high-resolution scanning electron microscope that features proprietary VP (variable pressure) technology for the GEMINI® column. This technology enables direct imaging of non-conductive or delicate specimens without the need for complicated sample preparation techniques. The VP technology is also available on the SUPRA® 40 VP and SUPRA® 60 VP. The operation of high vacuum mode or variable pressure mode can be easily selected with a simple mouse click. The SUPRA® 55VP offers the highest resolution available today, comparable with “in-lens instruments”, combined with a superb large fully eucentric 5” stage and a large multi-functional specimen chamber. It has been designed for the most demanding applications in nanotechnology, with sub-nm resolution readily attainable. This makes the SUPRA® 55VP a versatile and user-friendly tool for a wide range of applications.Documents
No documents
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116432
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ZEISS / CARL ZEISS
SUPRA 55VP
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
116432
Wafer Sizes:
Unknown
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
-Comments: System decommissioned in July 2024 from operational. New tip is required.Configuration
-Windows OS: W10 -Software Version: SmartSEM (v6) -Source Type: TFE -Variable Pressure: Yes -Primary Pump: Turbo -Detector 1: Everheart Thornley Secondary Electron Detector -Detector 2: Inlens detectorOEM Model Description
The SUPRA® 55VP is a high-resolution scanning electron microscope that features proprietary VP (variable pressure) technology for the GEMINI® column. This technology enables direct imaging of non-conductive or delicate specimens without the need for complicated sample preparation techniques. The VP technology is also available on the SUPRA® 40 VP and SUPRA® 60 VP. The operation of high vacuum mode or variable pressure mode can be easily selected with a simple mouse click. The SUPRA® 55VP offers the highest resolution available today, comparable with “in-lens instruments”, combined with a superb large fully eucentric 5” stage and a large multi-functional specimen chamber. It has been designed for the most demanding applications in nanotechnology, with sub-nm resolution readily attainable. This makes the SUPRA® 55VP a versatile and user-friendly tool for a wide range of applications.Documents
No documents