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ZEISS / CARL ZEISS 1560
  • ZEISS / CARL ZEISS 1560
  • ZEISS / CARL ZEISS 1560
  • ZEISS / CARL ZEISS 1560
  • ZEISS / CARL ZEISS 1560
  • ZEISS / CARL ZEISS 1560
Description
No description
Configuration
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.
OEM Model Description
None Provided
Documents

No documents

CATEGORY
SEM / FIB

Last Verified: Over 60 days ago

Key Item Details

Condition:

Used


Operational Status:

Installed / Idle


Product ID:

102936


Wafer Sizes:

6"/150mm


Vintage:

1999


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ZEISS / CARL ZEISS

1560

verified-listing-icon
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
listing-photo-57975c1fa275444b9499587a31ec686c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77985/57975c1fa275444b9499587a31ec686c/b2d18a6967a94542b31a87cc8392756b_389d5839d5de46a9b64c372ea2e9d1051201a_mw.jpeg
listing-photo-57975c1fa275444b9499587a31ec686c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77985/57975c1fa275444b9499587a31ec686c/1cd1fced671e41c490b6c310e4e1315b_4258746575ce41d89e572aae2b11384745005c_mw.jpeg
listing-photo-57975c1fa275444b9499587a31ec686c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77985/57975c1fa275444b9499587a31ec686c/617d42791be54875a3b676437270ad33_3412e74b52a940e5ab462350057e2e391201a_mw.jpeg
listing-photo-57975c1fa275444b9499587a31ec686c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77985/57975c1fa275444b9499587a31ec686c/28d73157e63144a6ba1cd69ba74c9e1b_eb95f00b385f4c59ab8a95d6abaac7c81201a_mw.jpeg
listing-photo-57975c1fa275444b9499587a31ec686c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77985/57975c1fa275444b9499587a31ec686c/25b78d2cb7bc4fbd829b41c590573ba3_75187b2b7097497c83ad51d897db2d141201a_mw.jpeg
Key Item Details

Condition:

Used


Operational Status:

Installed / Idle


Product ID:

102936


Wafer Sizes:

6"/150mm


Vintage:

1999


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No description
Configuration
-ZEISS LEO - 1560 Scanning Electron Microscope (SEM) -Vintage 1999, bought second hand. Installed by Zeiss certified vendor. -6" stage and loadlock. 6” wafer loading thru the loadlock is possible. -Field 6” loadlock and stage. -Schottky field emission gun -In-lens SE & E-T SE detectors -Capable of 1nm resolution at 20kV -4" max wafer diameter loading with the load lock, 6'' max loading through the chamber door -Upgraded to uniplinth. Runs Smartsem v5. -Known issues: Some Flickering on image of chamberscope. -Upgraded with integrated Current monitor on stage, readable in software. -Comes with a variety of sample and wafer holders.
OEM Model Description
None Provided
Documents

No documents