Description
Asset Description - Focus Ion Beam Mill Software Version - Windows CIM - NONE Process - Focus Ion Beam Mill Fab Section - Test Excluded Items List (Pumps, Chillers & Abatement are all excluded)Configuration
System Type Description Quantity Main System FIB tool designed for Packaging and Deep cuts 1 Factory Interface NONE Options System Others Handler System ManualOEM Model Description
The Orion NanoFab Helium Ion Microscope (HIM) operates using ionized Helium or Neon gases rather than electrons for imaging and milling of materials. Helium is typically used for imaging and milling very thin films (e.g. graphene), with a spot size ~0.5 nm. Neon is is heavier, and thus better adapted for milling bulk materials and thin films with a spot size of ~2 nm.Documents
Verified
CATEGORY
SEM / FIB
Last Verified: 16 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136497
Wafer Sizes:
8"/200mm
Vintage:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ZEISS / CARL ZEISS
ORION NanoFab
CATEGORY
SEM / FIB
Last Verified: 16 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
136497
Wafer Sizes:
8"/200mm
Vintage:
2015
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available