Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Orion NanoFab Helium Ion Microscope (HIM) operates using ionized Helium or Neon gases rather than electrons for imaging and milling of materials. Helium is typically used for imaging and milling very thin films (e.g. graphene), with a spot size ~0.5 nm. Neon is is heavier, and thus better adapted for milling bulk materials and thin films with a spot size of ~2 nm.Documents
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Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
113452
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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ZEISS / CARL ZEISS
ORION NanoFab
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
113452
Wafer Sizes:
Unknown
Vintage:
Unknown
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
No descriptionConfiguration
No ConfigurationOEM Model Description
The Orion NanoFab Helium Ion Microscope (HIM) operates using ionized Helium or Neon gases rather than electrons for imaging and milling of materials. Helium is typically used for imaging and milling very thin films (e.g. graphene), with a spot size ~0.5 nm. Neon is is heavier, and thus better adapted for milling bulk materials and thin films with a spot size of ~2 nm.Documents
No documents