Description
FE SEMConfiguration
No ConfigurationOEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.Documents
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HITACHI
S-5500
Verified
CATEGORY
SEM / FIB
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
91712
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
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Transaction Insured by Moov
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Refurbishment Services
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HITACHI
S-5500
CATEGORY
SEM / FIB
Last Verified: 19 days ago
Key Item Details
Condition:
Used
Operational Status:
Unknown
Product ID:
91712
Wafer Sizes:
12"/300mm
Vintage:
Unknown
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
Description
FE SEMConfiguration
No ConfigurationOEM Model Description
The S-5500, Immersion Lens system which generates the highest resolution images in the world(*1)(0.4nm at 30kV. The S-5500 have improved performance over that of its predecessor, the S-5200. [Main features of S-5500] (1) The world’s highest resolution, 0.4 nm at 30 kV, achieved by the use of a new electron optics system (as of October 2004). (2) New BF (bright field)/ DF (dark field) Duo STEM (scanning transmission electron microscopy) detector allows simultaneous display of BF and DF STEM images. In DF STEM mode, this detector is capable of providing images with variable detection angles. This new detection system greatly extends the usage of low accelerating voltage STEM at 30 kV.Documents
No documents