Description

The S-4700 Type a high-resolution electron microscope. This unit has been meticulously maintained by Hitachi Trained Engineers and has benefited from continuous coverage under a service contract since its original manufacture and installation in the United States.

Configuration

Water Chiller Rotary Pumps x2 Air Compressor HP Computer Keyboard / Mouse Toolbox and tools Secondary electron image resolution: 2.1 nm at 1 kV 1.5 nm at 15 kV Electron optics: Electron gun Cold field emission electron source Acc. voltage 0.5 ~ 30 kV (variable at 0.1 kV/step) Probe current 1 pA ~ 2 nA (depends on Acc. voltage) Magnification ×20 ×500,000 Objective aperture Heated movable aperture, 4-opening, selectable and alignable outside the vacuum Image display: Operation/display OS: Windows 2000 Scan mode: Normal, Split/dual mag./line scan, position set, spot, AAF, SAA, oblique Frame memory: 640 × 480 pixels, 1,280 × 960 pixels, 2,560 × 1,920 pixels Image filing Image data base with various reference functions built-in Image file format BMP, TIFF, JPEG selectable Scan speed TV, slow (0.5 ~ 40 s/frame) for viewing Slow (40 ~ 320 s/frame) for recording Image processing Automatic image brightness & contrast, raster rotation, autofocus, auto-stigmation, averaging, frame integration, color display Auto data recording Film numbering, acc. voltage, micron bar with a scale, magnification, date, hours and working distance Electrical image shift ±15 microns (at W.D = 12 mm) Vacuum system System Automatic vacuum sequence with pneumatic valve controls Evacuation: Vacuum ~10–7 Pa (electron gun), ~10–4 Pa (specimen chamber) Pumps Fore pumps 140 l/min (168 l/min) Diffusion pump 570 l/s × 1 set, and Ion pumps × 3 sets Protection System protection against power, water and vacuum failures. Dimensions & weight: Column 82 × 88 × 165 (H) cm, 410 kg (for type II stage) Display 120 × 90 × 137(H) cm, 235 kg Ion pump power supply 37 × 60 × 60 (H) cm, 75 kg Power unit 39 × 70 × 47 (H) cm, 35 kg

OEM Model Description

The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.

Documents

No documents

HITACHI

S-4700 I

Verified

SEM / FIB

Last Verified: 15 days ago

Key Item Details

Condition:

Used

Operational Status:

Installed / Running

Product ID:

144526

Wafer Sizes:

Unknown

HDD / Software:

Yes

Resolution:

1.5 nm

Electron:

Cold Field Emission

Loadlock:

Type 1 4 Inch

Detectors:

SE detector, Upper and Lower

Vintage:

2001

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

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