Description
Condition- Deinstalled & Vinyl Packed Working condition before de-installedConfiguration
Simple Packing List： ①Main Body(Colum Unit) ②Display Unit(Operation Table) ③Air Compressor(Hitachi) ④Rotary Pump(Ulvac/GLD136B) ⑤EDS(EDAX/OCTANE Plus) ⑥Navigation Camera ⑦ESED(Optional accssories) ●Simple performance： ①Resolution： SE 3.0nm at 30kV(High vacuum mode) 10nm at 3kV(High Vacuum mode) BSE 4.0nm at 30kV(Low vacuum mode) ②Magnification：×5～×300,000 ③Accelerating voltage：0.3～30kV ④Specimen stage：X 150mm・Y 110mm・Z 5-65mm・R 360℃・T -20℃-90℃ ⑤Maximum specimen size：300mm in diameter ⑥Software：Windows7 of SEM, EDS PCOEM Model Description
S-3700N is designed as a new series of Tungsten-type VP-SEM to accommodate sample diameters up to 300mm using a new large specimen chamber and a large specimen stage. Moreover, simultaneous accommodations of accessory attachments for EDX, WDX and EBSP (*1) analyses are possible at optimized analytical geometry. The specimen stage has a wide traverse range for observation of sample areas up to 203mm diameter and up to 110mm height with EDX and WDX analysis.Documents
HITACHI
S-3700N
Verified
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
78351
Wafer Sizes:
Unknown
Vintage:
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
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Refurbishment Services
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HITACHI
S-3700N
CATEGORY
SEM / FIB
Last Verified: Over 60 days ago
Key Item Details
Condition:
Used
Operational Status:
Deinstalled
Product ID:
78351
Wafer Sizes:
Unknown
Vintage:
2012
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available